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Effect of atomic layer deposition on the quality factor of silicon nanobeam cavities

Research Area: Nanophotonics Year: 2012
Type of Publication: Article Keywords: thin film deposition, atomic layer deposition, ALD, nanophotonics, silicon photonics, 1D photonic crystal cavities, quality factor, mode volume
Authors: Gehl, M.; Gibson, R.; Hendrickson, J.; Homyk, Andrew; Saynatjoki, A.; Alasaarela, T.; Karvonen, L.; Tervonen, A.; Honkanen, S.; Zandbergen, S.; Richards, B. C.; Olitzky, J. D.; Scherer, Axel; Khitrova, G.; Gibbs, H. M.; Kim, J. -Y.; Lee, Y. -H.
Journal: Journal of the Optical Society of America B Volume: 29
Number: 2 Pages: A55-A59
Month: January
In this work we study the effect of thin-film deposition on the quality factor (Q) of silicon nanobeam cavities. We observe an average increase in the Q of 38±31% in one sample and investigate the dependence of this increase on the initial nanobeam hole sizes. We note that this process can be used to modify cavities that have larger than optimal hole sizes following fabrication. Additionally, the technique allows the tuning of the cavity mode wavelength and the incorporation of new materials, without significantly degrading Q.
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