Electronic Nanostructures

1.Roukes ML; Scherer A; Allen SJ Jr; Craighead HG Jr; Ruthen RM; Beebe EO; Harbison JP, “Quenching of the Hall effect in a one-dimensional wire’, PHYSICAL REVIEW LETTERS, Vol.59, no.26, 1987, pp.3011-14.

2.Smet JH; Weiss D; vonKlitzing K; Coleridge PT; Wasilewski ZW; Bergmann R; Schweizer H; Scherer A., “Composite fermions in periodic and random antidot lattices”, PHYSICAL REVIEW B 1997, Vol 56, Iss 7, pp 3598-3601.

3.Roukes.ML; Thornton TJ; Scherer A; Simmons JA; Van der Gaag BP; Beebe EO, “Electron waveguide junctions: scattering from a microfabrication-imposed potential”, PROCEEDINGS OF A NATO ADVANCED RESEARCH WORKSHOP. PLENUM, 1990, pp.71-82.

4.Thornton TJ; Roukes ML; Scherer; Van der Gaag B, “Ballistic electron transport in a gated constriction”, PROCEEDINGS OF A NATO ADVANCED RESEARCH WORKSHOP. PLENUM. 1990, pp.25-32.

5.Thornton TJ; Roukes ML; Scherer A; Van der Gaag BP “Microfabrication and electron-scattering in very small devices”, INSITUTE OF PHYSICS CONFERENCE SERIES 1990, iss 106, pp 861-868.

6.Roukes ML; Scherer A; Van der Gaag BP “Are transport anomalies in electron wave-guides classical”, PHYSICAL REVIEW LETTERS 1990, vol 64, iss 10, pp 1154-1157.

7.Scherer A; Van der Gaag BP; Beebe ED; Lin PSD, “Fluoride etch masks for high-resolution pattern transfer”, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY b 1990, vol 8, iss 1, pp 28-32.

8.Thornton TJ; Roukes ML; Scherer A; Vandegaag BP, “Boundary scattering in quantum wires”, PHYSICAL REVIEW LETTERS 1989, vol 63, iss 19, pp 2128-2131.

9.Craighead HG; Scherer A; Roukes ML, “Fabrication of ultra-small structures; quantum wires”, PROCEEDING OF THE FIFTH INTERNATIONAL WINTER SCHOOL. SPRINGER-VERLAG, 1988, pp. 2-13.

10.Scherer A; Roukes ML “quantum device microfabrication - resolution limits of ion-beam patterning”, APPLIED PHYSICS LETTERS 1989, vol 55, iss 4, pp 377-379.

11.Cheeks.TL; Roukes ML; Scherer A; Van der Gaag BP; Craighead HG, “Ion damage studies in GaAs-AlGaAs ultra-narrow wires” SYMPOSIUM, MATER. RES. SOC., 1989, PP. 701-6.

12.Cheeks TL; Roukes ML; Scherer A; Craighead HG “Narrow conducting channels defined by helium ion-beam damage”, APPLIED PHYSICS LETTERS 1988, vol 53, iss 20, pp 1964-1966.

13.Roukes ML; Scherer A; Craighead HG; Allen SJ; Ruthen RM; Beebe ED; Harbison JP “Transport in ultra-narrow quantum well wires SURFACE SCIENCE 1988, vol 196, iss 1-3, pp 79-80.

14.Roukes ML; Scherer A; Allen SJ; Craighead HG; Ruthen RM; Beebe ED; Harbison JP “Quenching of the hall-effect in a one-dimensional wire”, PHYSICAL REVIEW LETTERS 1987, vol 59, iss 26, pp 3011-3014.

15.Scherer A; Craighead HG; Roukes ML; Harbison JP “Electrical damage induced by ion-beam etching of gaas JOURNAL OF VACUUM SCIENCE & TECHNOLOGY b 1988, vol 6, iss 1, pp 277-279.

16.Cheeks T, Roukes ML; Scherer A; Schwartz SA; Hwang DM; Craighead HG “Damage studies of AaAs-AlGaAs ultra-narrow conducting channels”. JOURNAL OF ELECTRONIC MATERIALS 1988, vol 17, iss 4, pp s17-s17.

17.Scherer A; Roukes ML; Craighead HG; Ruthen RM; Beebe EO’ Harbison JP, “Ultranarrow conducting channels defined in GaAs-AlGaAs by low-energy ion damage”, APPLIED PHYSICS LETTERS, Vol.51, no.25, 21 Oec. 1987, pp.2133-5.

18.Craighead HG; Ruthen RM; Beebe ED; Harbison JP “Ultranarrow conducting channels defined in GaAs-AlGaAs by low-energy ion damage”, APPLIED PHYSICS LETTERS 1987, vol 51, iss 25, pp 2133-2135.